Your contact person
Adrian Bangerter
+41 62 285 80 13
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Microtester test systems for e-tests, functional tests, IC tests or high-current tests
With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
Customizing
Basic principle for highly precise contacting
Traceability and connection to MES systems
Easy operation
The intuitive operation of the Brick control system enables easy and clear handling, even with more complex systems. Even offset values or PRS points can be easily adjusted by finger via the touch surface.
Your contact person
Adrian Bangerter
+41 62 285 80 13
This email address is being protected from spambots. You need JavaScript enabled to view it.